On-wafer measurement techniques provide an essential pathway for characterising the performance of semiconductor devices at millimetre-wave frequencies. By directly interfacing with devices on the ...
The oscillating wave test system from HDW Electric can be used to identify, evaluate, and locate partial discharge (PD) faults in a cable insulation and in joints and terminations. The system can be ...
The Korea Research Institute of Standards and Science (KRISS, President Lee Ho Seong) has successfully developed a length measurement system that achieves a level of precision approaching the ...
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