On-wafer measurement techniques provide an essential pathway for characterising the performance of semiconductor devices at millimetre-wave frequencies. By directly interfacing with devices on the ...
There is no measurement that can directly observe the wave function of a quantum mechanical system, but the wave function is ...
The oscillating wave test system from HDW Electric can be used to identify, evaluate, and locate partial discharge (PD) faults in a cable insulation and in joints and terminations. The system can be ...
The Korea Research Institute of Standards and Science (KRISS, President Lee Ho Seong) has successfully developed a length measurement system that achieves a level of precision approaching the ...
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