One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...

The IEEE is working to define a uniform method for characterizing electrical circuit probe performance. The proposed standard, IEEE P1696, “Standard for Terminology and Test Methods for Circuit Probes ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

[Piffpaffpoltrie] had a problem. They found the InLine VA40R to be a perfectly usable multimeter, except for a couple of flaws. Most glaring among these were the tiny sockets for the test probes.

With its 400-MHz bandwidth, the HVD3220 differential probe from Teledyne LeCroy permits in-circuit GaN and SiC system testing. The high-voltage probe carries a 1500-VDC CAT III rating, as well as a ...

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...