Encounter Test Architect GXL can insert, synthesize, and validate a full-chip, low-power design-for-test (DFT) infrastructure. The software provides for scan insertion using Encounter RTL Compiler's ...

At Semicon West today, Advantest Corp. launched its plans for an industry-wide consortium aimed at solving the challenges of cost effectively testing complex logic devices, such as SOCs. Advantest ...

Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...