Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...
What you know may no longer be the best information. Such is the case when thinking about memories in a finFET world. As we get older the memory may start to fade, but that is not a viable option if ...
Some digital design and verification engineers imagine that their colleagues working on analog/mixed-signal (AMS) chips are jealous. After all, the digital development flow has enjoyed the benefits of ...
November 9, 2012. Synopsys Inc. has announced a new release of its DesignWare STAR Memory System, an automated pre- and post-silicon memory test, debug, diagnostic and repair solution that enables ...
Memoir Systems announced their Algorithmic memory awhile ago but its use required a custom design (see Algorithmic Memory Simplifies SoC Memory Subsystem Design). The idea was to take standard single ...
The emerging DDR3 memory standard will extend the performance range of DDR memories considerably, while maintaining some amount of backwards compatibility with the existing DDR2 memory standard. It is ...
Embedded Dynamic Random Access Memory (eDRAM) design is rapidly evolving to meet the escalating performance and energy efficiency demands of contemporary processors. This technology has emerged as a ...
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